Strain mapping at the nanoscale using precession electron diffraction in transmission electron microscope with off axis camera
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منابع مشابه
Scanning precession electron tomography for three-dimensional nanoscale orientation imaging and crystallographic analysis
Three-dimensional (3D) reconstructions from electron tomography provide important morphological, compositional, optical and electro-magnetic information across a wide range of materials and devices. Precession electron diffraction, in combination with scanning transmission electron microscopy, can be used to elucidate the local orientation of crystalline materials. Here we show, using the examp...
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تاریخ انتشار 2017